Priyank offers expertise in silicon wafer metrology and inspection processes for process and overlay control at semiconductor manufacturers. He is proficient in analyzing and interpreting statistical data using JMP (SAS) and R, leading the team to develop process and overlay control applications across IC makers to enhance product yield.
Lead Applications Engineer | Data Analyst at KLA-Tencor at KLA-Tencor
Jun 2014 - Present
- Leading Applications team to improve tool adoption for process and overlay control across logic and memory manufacturers. - Driving customer workshops and next-gen tool characterization and product demos. -Statistical data analysis and storytelling using JMP (SAS) and R. -Driving multiple product evaluation projects and product adoptions for KLA Tencor's inspection and metrology solutions.
M. Tech. at IIT Roorkee
Jun 2012 - Jun 2014
Institute Gold Medal and Late Sri Kanahiya Lal Goyal Cash Prize for obtaining highest CGPA (9.2) in M.Tech., 2014 (E&C Department).
B. Tech. at SGSITS, Indore
Jun 2008 - May 2012